Keysight Introduces New method to Improve Power Amplifier Testing Efficiency
The new Iterative Learning Control test method that significantly shortens Digital Pre-Distortion test times for power amplifiers.
Power amplifiers are a core component in wireless communication devices. Characterization of these components is a critical but time-consuming task that can take hours or even days during the research & development phase. By shortening the time it takes to complete the design and validation process, power amplifier manufacturers are able to accelerate their time-to-market.
Keysight meets this need by introducing the innovative ILC DPD test method that shortens DPD test time to minutes and accelerates R&D time from test validation to product design and optimization. As a part of Keysight's comprehensive High Frequency Measurement Solution portfolio, the ILC test method runs on the N9055EM0E Power Amplifier Measurement Application and uses the VXG Vector Signal Generator and PXA Signal Analyzer to provide industry-leading test performance for signal generation and analysis.
The ILC DPD test method offers the following benefits:
- Faster Test Speeds – Optimizes the N9055EM0E software to reduce the characterization of power amplifiers to minutes.
- Integrated User Interface – Shows both pre-DPD and post-DPD measurement results in one screen for easier operation and integration when characterizing a power amplifier with multiple test instruments.
- Measurement Accuracy and Performance – Provides industry-leading performance when characterizing power amplifier by removing the limitations of signal analyzer and generator and determining the real-world performance of power amplifier designs.
